Parametric testing allows for simultaneously forcing a current, while measuring a voltage on a single node, or vice versa. This can be used in many applications, particularly automated test equipment (ATE) used in the semiconductor design and manufacturing industry. Parametric testing using ATE is the standard for the IC production industry. My focus however is to create a system that tests for basic functionality following invasive sample prep for physical debug of packaged integrated circuits. An entire state of the art setup costs in the range of $125k and can see heavy usage for many debug tasks. My project is designed to do the necessary test for the application at less than $2k. Subject: Electrical engineering, parametric measurement unit, automated test equipment, physical debug of IC,
