This project presents a proof of concept optical vibration detection platform intended for scanning electron microscope (SEM) related diagnostic applications. The system uses reflected laser displacement sensing to detect vibration based optical disturbances. A photodiode converts incident light variation into electrical current, which is conditioned using a transimpedance amplifier, digitized with a 16-bit analog-to-digital converter, and transmitted wirelessly through an embedded microcontroller for visualization. The final implementation combines: 1) Optical vibration sensing 2) Analog signal conditioning 3) Wireless embedded telemetry 4) Camera-assisted optical alignment 5) Custom desktop heatmap visualization
